Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications

Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications

ISBN10: 3527320474
ISBN13: 978-3527320479
Author: -
Title: Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications
Publisher: Wiley-VCH; 2 edition (June 7, 2011)
Language: English
Size ePub: 1284 kb
Size PDF: 1281 kb
Rating: 4.2/5
Votes: 266
Pages: 558 pages
Subcategory: Engineering

Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications



Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.

From a Review of the First Edition (edited by Bubert and Jenett)
"... a useful resource..."
(Journal of the American Chemical Society)

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