Scanning Probe Techniques for Materials Characterization At Nanometer Scale (Proceedings of the International Symposium, Proceedings Volume 2000-35)

Scanning Probe Techniques for Materials Characterization At Nanometer Scale (Proceedings of the International Symposium, Proceedings Volume 2000-35) by Douglas C. Hansen, Hugh Solomon Isaacs, Karl Sieradzki

ISBN10: 1566773024
ISBN13: 978-1566773027
Author: Douglas C. Hansen, Hugh Solomon Isaacs, Karl Sieradzki
Title: Scanning Probe Techniques for Materials Characterization At Nanometer Scale (Proceedings of the International Symposium, Proceedings Volume 2000-35)
Publisher: The Electrochemical Society, Inc. (2001)
Language: English
Size ePub: 1814 kb
Size PDF: 1418 kb
Rating: 4.7/5
Votes: 441
Pages:
Subcategory: Engineering